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Journal Articles

Improved model for single-event burnout mechanism

Kuboyama, Satoshi*; Ikeda, Naomi*; Hirao, Toshio; Matsuda, Sumio*

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.165 - 168, 2004/10

no abstracts in English

Journal Articles

Research of single-event burnout in bipolar transistors

Hirao, Toshio; Shindo, Hiroyuki*; Kuboyama, Satoshi*; Nagai, Yuki*; Ohira, Hideharu*; Ito, Hisayoshi; Matsuda, Sumio*

JNC TN7200 2001-001, p.66 - 68, 2002/01

no abstracts in English

Journal Articles

Mechanism for single-event burnout of bipolar transistors

Kuboyama, Satoshi*; Suzuki, Takahiro*; Hirao, Toshio; Matsuda, Sumio*

IEEE Transactions on Nuclear Science, 47(6), p.2634 - 2639, 2000/12

 Times Cited Count:7 Percentile:46.88(Engineering, Electrical & Electronic)

no abstracts in English

JAEA Reports

Irradiation effect of transistor by Co-60 gamma ray and electron beam; Effects of dose rate and exposure temperatures

Hirao, Toshio; Yoshikawa, Masahito; Morita, Yosuke; *; *

JAERI-M 89-207, 128 Pages, 1989/12

JAERI-M-89-207.pdf:2.62MB

no abstracts in English

Journal Articles

Effect of irradiation temperature on the change of characteristics of bipolar transistor.

; Hayakawa, Naohiro; Kawakami, Waichiro

EIM-86-137, p.77 - 85, 1986/00

no abstracts in English

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